发明名称 A METHOD OF MAKING METAL GATE TRANSISTORS
摘要 A semiconductor device has a gate with three conductive layers over a high K gate dielectric. The first layer is substantially oxygen free. The work function is modulated to the desired work function by a second conductive layer in response to subsequent thermal processing. The second layer is a conductive oxygen-bearing metal. With sufficient thickness of the first layer, there is minimal penetration of oxygen from the second layer through the first layer to adversely impact the gate dielectric but sufficient penetration of oxygen to change the work function to a more desirable level. A third layer, which is metallic, is deposited over the second layer. A polysilicon layer is deposited over the third layer. The third layer prevents the polysilicon layer and the oxygen-bearing layer from reacting together.
申请公布号 US2008001202(A1) 申请公布日期 2008.01.03
申请号 US20060427980 申请日期 2006.06.30
申请人 SCHAEFFER JAMES K;GILMER DAVID C;RAYMOND MARK V;TOBIN PHILIP J;SAMAVEDAM SRIKANTH B 发明人 SCHAEFFER JAMES K.;GILMER DAVID C.;RAYMOND MARK V.;TOBIN PHILIP J.;SAMAVEDAM SRIKANTH B.
分类号 H01L29/94 主分类号 H01L29/94
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