LATERAL AND LONGITUDINAL METROLOGY SYSTEM

摘要

The invention relates to a satellite metrology system for satellite formation flight comprising at least one reference satellite (SR) and one secondary satellite (SS). In the reference satellite, an optical source (SO) emits a light beam intended to illuminate the secondary satellite (SS) and a set of light detectors (CCD) detects the light reflected by the secondary satellite. A measuring circuit (CI) is used for detecting the detector or detectors that receive the light from the secondary satellite. In the secondary satellite (SS) at least one reflector (RR 1 ) receives the illumination light from the reference satellite and reflects it towards the set of detectors (CCD) of the reference satellite.