发明名称 Method of fabricating recess gate in semiconductor device
摘要 A method of fabricating a semiconductor device includes forming an isolation structure in a substrate to define an active region, forming a recess mask pattern over the isolation structure and the active region, etching the isolation structure exposed by the recess mask pattern to a certain depth, etching the substrate to form a recess pattern, and forming a gate electrode over the recess pattern.
申请公布号 US2008003748(A1) 申请公布日期 2008.01.03
申请号 US20060644880 申请日期 2006.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO YONG-TAE;KIM EUN-MI
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
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