Dual in-line memory module, memory test system, and method for operating the dual in-line memory module

摘要

A dual in-line memory module (DIMM) for use in test includes a memory array with a plurality of memories, a test signal input/output unit, and a normal data input/output unit. The test signal input/output unit is provided in the respective memories to perform an input/output operation of a test signal with an external test mode controller for a test mode operation. The normal data input/output unit is provided in the respective memories to perform an input/output operation of a normal data with an external memory controller for a normal mode operation.