Scan-based testing of devices implementing a test clock control structure (TCCS)

摘要

Methods and computer readable media for performing scan-based testing of circuits using one or more test clock control structures are disclosed. In one embodiment, a method includes performing an intra-domain test to exercise a first subset of domains of the plurality of circuits implementing dynamic fault detection test patterns. It also includes performing an inter-domain test to exercise a second subset of domains of the plurality of circuits implementing dynamic fault detection test patterns. The dynamic fault detection test patterns can include, for example, last-shift-launch test patterns and broadside test patterns. In various embodiments, the method can include configuring different programmable test clock controllers to test different domains substantially in parallel.