发明名称 SELECTIVE BARRIER SLURRY FOR CHEMICAL MECHANICAL POLISHING
摘要 An aqueous polishing composition for a semiconductor substrate, and a method for polishing a semiconductor substrate by using the composition are provided to reduce the dishing of interconnect metal by accelerating the removing velocity of tantalum-containing materials, thereby protecting a low dielectric layer from a cap layer. An aqueous polishing composition comprises 0.05-50 wt% of an abrasive; and 0.001-5 wt% of iota carrageenan which has the concentration useful for accelerating the removing velocity of tantalum, tantalum nitride and other tantalum-containing materials. Preferably the coating whose removing velocity is reduced by the iota carrageenan, is selected from the group consisting of SiC, SiCN, Si3N4 and CDO; and the abrasive is selected from an inorganic oxide, a metal boride, a metal carbide, a metal nitride and a polymer particle.
申请公布号 KR20080000518(A) 申请公布日期 2008.01.02
申请号 KR20070061529 申请日期 2007.06.22
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. 发明人 BIAN JINRU
分类号 C09K3/14 主分类号 C09K3/14
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