发明名称 |
VARIABLE RESISTANCE RANDOM ACCESS MEMORY DEVICE COMPRISING N+ INTERFACIAL LAYER |
摘要 |
<p>A variable resistance random access memory is provided to use a low-cost metal as a lower electrode by forming an n+ interface layer between the lower electrode and an n buffer layer and to decrease a manufacturing cost. A variable resistance random access memory includes a lower electrode(20), an n+ interface layer(22), a buffer layer(24), an oxide layer(26), and an upper electrode(28). The n+ interface layer is formed on the lower electrode. The buffer layer is formed on the n+ interface layer. The oxide layer is formed on the buffer layer and has a variable resistance. The upper electrode is formed on the oxide film. The oxide film is made of a p-type transition metal oxide.</p> |
申请公布号 |
KR20080000358(A) |
申请公布日期 |
2008.01.02 |
申请号 |
KR20060058098 |
申请日期 |
2006.06.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO, CHOONG RAE;LEE, EUN HONG;GENRIKH STEFANOVICH;BOU RIM |
分类号 |
H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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