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发明名称
SIMULTANEOUS CORE TESTING IN MULTI-CORE INTEGRATED CIRCUITS
摘要
申请公布号
EP1872146(A1)
申请公布日期
2008.01.02
申请号
EP20060739139
申请日期
2006.03.21
申请人
ADVANCED MICRO DEVICES, INC.
发明人
KUO, TING-YU;ELVEY, DWIGHT, K.
分类号
G01R31/3185
主分类号
G01R31/3185
代理机构
代理人
主权项
地址
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