发明名称 Temperature detector providing multiple detected temperature points using single branch and method of detecting shifted temperature
摘要 A temperature detector and method of detecting a shifted temperature provides multiple detected temperature points using a single branch. The temperature detector generates multiple detected temperature points in response to temperature control signals sequentially generated in a single branch. Since a shifted temperature for the single branch is found and a trimming operation in response to the shifted temperature is carried out, the test time is reduced. Various refresh periods can be set in response to various trip point temperatures and thus power consumption of a DRAM can be decreased.
申请公布号 US7315792(B2) 申请公布日期 2008.01.01
申请号 US20050151448 申请日期 2005.06.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 MIN YOUNG-SUN;KIM NAM-JONG
分类号 G01F15/00;G11C7/00;G11C7/04;G11C11/406;G11C29/02 主分类号 G01F15/00
代理机构 代理人
主权项
地址