发明名称 Monochromator and scanning electron microscope using the same
摘要 An invention providing a scanning electron microscope composed of a monochromator capable of high resolution, monochromatizing the energy and reducing chromatic aberrations without significantly lowering the electrical current strength of the primary electron beam. A scanning electron microscope is installed with a pair of sectorial magnetic and electrical fields having opposite deflection directions to focus the electron beam and then limit the energy width by means of slits, and another pair of sectorial magnetic and electrical fields of the same shape is installed at a position forming a symmetrical mirror versus the surface containing the slits. This structure acts to cancel out energy dispersion at the object point and symmetrical mirror positions, and by spatially contracting the point-converged spot beam with a converging lens system, improves the image resolution of the scanning electron microscope.
申请公布号 US7315024(B2) 申请公布日期 2008.01.01
申请号 US20060344529 申请日期 2006.02.01
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 OSE YOICHI;TAYA SHUNROKU;TODOKORO HIDEO;OTAKA TADASHI;SATO MITSUGU;EZUMI MAKOTO
分类号 G21K7/00;G01N23/00;H01J37/05;H01J37/09;H01J37/153;H01J37/26;H01J37/28;H01J49/46 主分类号 G21K7/00
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