| 摘要 |
There is disclosed a confocal microspectroscope comprising an excitation light source having two or more semiconductor light sources formed on the same chip by a semiconductor process and covering a predetermined wavelength region, a semiconductor light source control unit for controlling on/off of the semiconductor light sources, and a microscope main body having a scanning unit for scanning light from the excitation light source on a specimen and a confocal detector for detecting the light emitted from the specimen, wherein wavelengths of the light emitted from the two or more semiconductor light sources differ by a predetermined wavelength.
|
