| 摘要 |
The present invention is related to a method for testing a micro-electronic device, by applying a plurality of test vectors to said device, and measuring for each test vector, the quiescent supply current I<SUB>DDQ</SUB>, to said device, wherein each I<SUB>DDQ </SUB>measured value is divided by another I<SUB>DDQ </SUB>value, and wherein the result of said division is compared to a predefined reference, resulting in a pass or fail decision for said device. |
