发明名称 |
A MATERIAL ARCHITECTURE FOR THE FABRICATION OF LOW TEMPERATURE TRANSISTOR |
摘要 |
A structure and method for fanning a carbon-containing layer in at least a portion of the end of range regions of implanted PAI and/or doped regions- The C-containing layer/region getters defects from the implanted PAI region or doped region. Example embodiments show a C-containing layer tinder at NET. Other example embodiments show an implanted C-containing regions inplanted into the TOR region of implanted doped regions, such as pocket regions, SID regions and SDE regions- Low temperature anneals can be used because the carbon-containing layer reduces defects.
|
申请公布号 |
SG137856(A1) |
申请公布日期 |
2007.12.28 |
申请号 |
SG20070179013 |
申请日期 |
2005.06.03 |
申请人 |
CHARTERED SEMICONDUCTOR MANUFACTURING LTD. |
发明人 |
FOONG TAN CHUNG;JINPING LIU;HYEOKJAE LEE;CHOK TEE KHENG;QUEK ELGIN |
分类号 |
|
主分类号 |
|
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|