发明名称 A MATERIAL ARCHITECTURE FOR THE FABRICATION OF LOW TEMPERATURE TRANSISTOR
摘要 A structure and method for fanning a carbon-containing layer in at least a portion of the end of range regions of implanted PAI and/or doped regions- The C-containing layer/region getters defects from the implanted PAI region or doped region. Example embodiments show a C-containing layer tinder at NET. Other example embodiments show an implanted C-containing regions inplanted into the TOR region of implanted doped regions, such as pocket regions, SID regions and SDE regions- Low temperature anneals can be used because the carbon-containing layer reduces defects.
申请公布号 SG137856(A1) 申请公布日期 2007.12.28
申请号 SG20070179013 申请日期 2005.06.03
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD. 发明人 FOONG TAN CHUNG;JINPING LIU;HYEOKJAE LEE;CHOK TEE KHENG;QUEK ELGIN
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