发明名称 SEMICONDUCTOR DEVICE AND FABRICATING METHOD THEREOF
摘要 A semiconductor device and a manufacturing method thereof are provided to select various temperature ranges of a heat process by performing only a process for manufacturing a metal line layer. A first substrate(100) includes a transistor layer(110) on which a transistor is formed. A second substrate(200) includes metal line layers(210,220,230,240,250,260) on which metal lines are formed. A connection electrode electrically connects the transistor formed on the first substrate to the metal line formed on the second substrate. The first substrate includes the transistor layer formed on a semiconductor substrate(205) and a metal line layer(120) formed on the transistor layer. The first substrate includes a contact plug connected to the transistor. The second substrate includes metal line layers and a through electrode(207). The through electrode is connected to the metal line and passes through the semiconductor substrate.
申请公布号 KR100789570(B1) 申请公布日期 2007.12.28
申请号 KR20060080121 申请日期 2006.08.23
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 HAN, JAE WON
分类号 H01L21/28 主分类号 H01L21/28
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