发明名称 COMPOSITIONS FOR CHEMICAL MECHANICAL POLISHING SILICA AND SILICON NITRIDE HAVING IMPROVED ENDPOINT DETECTION
摘要 <p>The present invention provides a method of manufacturing a composition for polishing silica and silicon nitride on a semiconductor substrate. The method comprises ion-exchanging carboxylic acid polymer to reduce ammonia and combining by weight percent 0.01 to 5 of the ion-exchanged carboxylic acid polymer with 0.001 to 1 quaternary ammonium compound, 0.001 to 1 phthalic acid and salts thereof, 0.01 to 5 abrasive, and balance water.</p>
申请公布号 SG137837(A1) 申请公布日期 2007.12.28
申请号 SG20070040553 申请日期 2007.06.05
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, I 发明人 MUELLER BRIAN L.
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