INSPECTION SYSTEM, ITS INSPECTION CIRCUIT, SEMICONDUCTOR DEVICE, DISPLAY DEVICE, AND INSPECTION METHOD OF SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To provide an inspection system hardly increasing a circuit area, and capable of preventing increase of cost.

SOLUTION: An inspection circuit 3 is interposed between a first circuit 1 and a second circuit 2. The inspection circuit 3 includes a signal transmission control function 4 and an inspection output function 5. The signal transmission control function 4 controls signal transmission between the first circuit 1 and the second circuit 2. The inspection output function 5 outputs the output of the first circuit 1 for inspection use through the inspection circuit 3. In this invention, the signal transmission control function 4 and the inspection output function 5 share a part of a circuit achieving the mutual functions. The first circuit 1, the second circuit 2 and the inspection circuit 3 are arranged on the same board. The inspection circuit 3 uses the signal transmission control function 4 and the inspection output function 5 by changing over them.

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