发明名称 METHOD FOR CALIBRATING ELECTRONIC COMPONENT TESTING APPARATUS
摘要 <p>A deviation quantity of a socket guide (73) from a socket (71) is calculated from the relative position of a socket camera (414) to the socket guide (73) and the relative position of the socket camera (414) to the socket (71). The relative position of a device camera (434) to the socket (71) is calculated by adding the deviation quantity to the relative position of the device camera (434) to the socket guide (73).</p>
申请公布号 WO2007148375(A1) 申请公布日期 2007.12.27
申请号 WO2006JP312255 申请日期 2006.06.19
申请人 KIKUCHI, ARITOMO;ADVANTEST CORPORATION;NAKAMURA, HIROTO 发明人 KIKUCHI, ARITOMO;NAKAMURA, HIROTO
分类号 G01R31/26 主分类号 G01R31/26
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