METHOD OF ANALYSING AN INTEGRATED CIRCUIT, METHOD OF OBSERVATION AND THEIR ASSOCIATED INSTALLATIONS

摘要

The invention relates to a method of analysing an integrated circuit comprising: a step (102) of applying laser radiation at a point on the surface of the circuit; a step (106) of exciting the circuit thus subjected to the laser radiation by applying an electrical excitation signal; a step (106) for receiving the response to the excitation of the circuit subjected to the laser radiation; a step (106) of measuring the phase difference between the response to the excitation of the circuit subjected to the laser radiation and a reference response of the circuit in the absence of laser radiation applied to the circuit. The invention also relates to an associated method of observation and an associated observation installation.