| 摘要 |
A measurement device capable of measuring a contact potential difference between a first surface and a second surface separated by an insulator, through the application of an external potential. The measurement device comprises a calibration system for determining an absolute value of work function of the first surface. The calibration system has a calibration sample and the measurement device further comprising a translocation means actuable to cause relative movement of the first surface and the calibration sample. The first surface and the calibration sample are typically provided within a housing. The calibration sample can have an absolute work function value lower then that of the first surface. The measurement device comprises a Kelvin probe 10 with tip 12 and light source 18. |
