发明名称 |
ABNORMAL AREA DETECTION DEVICE AND ABNORMAL AREA DETECTION METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a high speed and general abnormal region detection device for highly precisely detecting the presence and position of abnormality by using higher-order local autocorrelation features. <P>SOLUTION: This abnormal area detection device is provided with a means for extracting feature data by higher-order local autocorrelation for every pixel from image data; a means for adding the feature data about the pixel group of a predetermined range including pixels for every pixel; a means for calculating an index showing the abnormality of the feature data to a partial space showing a normal region; a means for deciding abnormality based on the index; and a means for outputting the pixel position decided to be abnormal. This abnormal area detection device may be provided with a means for extracting a plurality of higher-order local autocorrelation feature data whose displacement width is different and a means for searching a partial space showing a normal area based on main component vectors by a main component analyzing method from the feature data. Thus, it is possible to decide abnormality according to pixels, and to accurately detect the position of an abnormal area. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2007334766(A) |
申请公布日期 |
2007.12.27 |
申请号 |
JP20060167961 |
申请日期 |
2006.06.16 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
OTSU NOBUYUKI;NANRI TAKUYA |
分类号 |
G06T7/00;G01B11/24;G01N21/956;G06T1/00 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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