发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit wherein the generation of noises of power supply due to simultaneous switching of signal output and malfunction of a circuit resulted therefrom can be easily prevented. <P>SOLUTION: Each of input/output buffer cells 2 and 3 which are arranged around the chip of the semiconductor integrated circuit is provided with power supply pads 6 and 7 that receive at least either of first power supply voltage Vcc and second power supply voltage Vss to be supplied to an output buffer circuit 4, from the outside of the chip. Preferably, the semiconductor integrated circuit is provided with at least two kinds of input/output buffer cells, namely, a first input/output buffer cell 2 that is provided with one signal pad 5 and one first power supply pad 6 for receiving the first power supply voltage Vcc from the outside of the chip, and a second input/output buffer cell 3 that is provided with one signal pad 5 and one second power supply pad 7 for receiving the second power supply voltage Vss from the outside of the chip. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007335486(A) 申请公布日期 2007.12.27
申请号 JP20060163125 申请日期 2006.06.13
申请人 SHARP CORP 发明人 NISHIKAWA NORITAKA
分类号 H01L21/822;H01L21/82;H01L27/04;H03K19/0175 主分类号 H01L21/822
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