| 摘要 |
System and corresponding method for plotting an image on a thin material having variations in thickness. System ( 40 ) includes: a plotter unit ( 46 ), for plotting the image on a surface ( 48 ) of thin material ( 42 ); a control unit ( 50 ), for controlling plotter unit ( 46 ), for effecting the plotting; and a thickness measuring device ( 52 ), for measuring thickness ( 44 ) of thin material ( 42 ). Control unit ( 50 ) receives measured thickness values from thickness measuring device ( 52 ), and uses measured thickness values for adjusting plotting of the image via plotter unit ( 46 ), to compensate for variations in thickness ( 44 ) of thin material ( 42 ).
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