发明名称 SPECTRAL FUNDUS MEASURING APPARATUS AND ITS MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a spectral fundus measuring apparatus capable of easily and accurately specifying respective parts from spectral fundus images on the basis of spectral characteristics, and its measuring method. <P>SOLUTION: The spectral fundus image measuring apparatus 1 comprises an illumination optical system 10, a light receiving optical system 20 for picking up a series of the spectral fundus images of different wavelengths, an image processing part 7 for working the spectral fundus images, a storage part 7A, and a display part 7B. The image processing part 7 comprises a position correction part 72 for performing correction so as to match the positions of the respective parts for the series of spectral fundus images, and an image analysis part 73 for calculating the spectral characteristics of the respective parts on the spectral fundus images on the basis of the series of spectral fundus images corrected in the position correction part 72. The storage part 7A stores the spectral characteristics of the respective parts together with the standard spectral characteristics of the respective specified parts, and the image processing part 7 has a first grouping part 74A for grouping the respective parts corresponding to the specified parts by comparing the spectral characteristics of the respective parts with the standard wavelength characteristics of the respective specified parts. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007330558(A) 申请公布日期 2007.12.27
申请号 JP20060166691 申请日期 2006.06.15
申请人 TOPCON CORP 发明人 MIHASHI TOSHIBUMI;HIROHARA YOKO
分类号 A61B3/14 主分类号 A61B3/14
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