发明名称 APPARATUS FOR IMERSION LITHOGRAPHY
摘要 <p>An immersion lithography apparatus is provided to prevent generation of watermark by additionally and obliquely blowing air from the lateral surface of a wafer stage to the side of the wafer. An immersion lithography apparatus includes a wafer stage(100), a projection lens part(130), an air exhaust part(140) and an air absorption part(150). A watermark removing air exhaust part(140') is included in the lateral surface of the wafer stage. Air is obliquely blown to a contact portion of water and a wafer(110) to push up watermark.</p>
申请公布号 KR20070121379(A) 申请公布日期 2007.12.27
申请号 KR20060056364 申请日期 2006.06.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JIN SOO
分类号 H01L21/027 主分类号 H01L21/027
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