发明名称 A PLASMA ENHANCED ATOMIC LAYER DEPOSITION SYSTEM AND METHOD
摘要 A method for depositing a film on a substrate using a plasma enhanced atomic layer deposition (PEALD) process includes disposing the substrate in a process chamber configured to facilitate the PEALD process, introducing a first process material within the process chamber and introducing a second process material within the process chamber. Also included is coupling electromagnetic power to the process chamber during introduction of the second process material in order to generate a plasma that facilitates a reduction reaction between the first and second process materials at a surface of the substrate. A reactive gas is introduced within the process chamber, the reactive gas chemically reacting with contaminants in the process chamber to release the contaminants from at least one of a process chamber component or the substrate.
申请公布号 KR20070120986(A) 申请公布日期 2007.12.26
申请号 KR20077023334 申请日期 2006.03.15
申请人 TOKYO ELECTRON LIMITED 发明人 MATSUDA TSUKASA
分类号 H01L21/20;H01L21/205 主分类号 H01L21/20
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