摘要 |
An optical probe for use in infrared, near infrared, Raman, and other spectrometers includes a probe outer surface 200 with a cavity defined therein The probe emits light into a sample via emission locations 208 on the probe outer surface, at least one being in the cavity The light emitted into the sample is then located at collection locations 210, 212 which include at least two of (a) a reflectan collection location 210 located on the probe outer surface for collecting diffusely reflected light from any adjacent sample, (b) a transmittance collection location 212 situated in the cavity and receiving light transmitted across the cavity from an emission locatio situated on an opposite side of the cavity, and (c) a transflectance collection location 314 situated in the cavity and receiving transflected light emitted form an emission location in the cavity, with such light being reflected from a side of the cavity opposite the transflectance collection location.
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申请人 |
THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC;EBERSOLE, MATTHEW, D.;DRAPER, CARLA, S.;HIRSCH, JEFFEY |
发明人 |
EBERSOLE, MATTHEW, D.;DRAPER, CARLA, S.;HIRSCH, JEFFEY |