发明名称 MULTI-MODE SAMPLING PROBES
摘要 An optical probe for use in infrared, near infrared, Raman, and other spectrometers includes a probe outer surface 200 with a cavity defined therein The probe emits light into a sample via emission locations 208 on the probe outer surface, at least one being in the cavity The light emitted into the sample is then located at collection locations 210, 212 which include at least two of (a) a reflectan collection location 210 located on the probe outer surface for collecting diffusely reflected light from any adjacent sample, (b) a transmittance collection location 212 situated in the cavity and receiving light transmitted across the cavity from an emission locatio situated on an opposite side of the cavity, and (c) a transflectance collection location 314 situated in the cavity and receiving transflected light emitted form an emission location in the cavity, with such light being reflected from a side of the cavity opposite the transflectance collection location.
申请公布号 WO2007055876(A3) 申请公布日期 2007.12.21
申请号 WO2006US40544 申请日期 2006.10.16
申请人 THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC;EBERSOLE, MATTHEW, D.;DRAPER, CARLA, S.;HIRSCH, JEFFEY 发明人 EBERSOLE, MATTHEW, D.;DRAPER, CARLA, S.;HIRSCH, JEFFEY
分类号 G01B9/02 主分类号 G01B9/02
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