发明名称 SECONDARY ION MASS SPECTROMETRY METHOD AND IMAGING METHOD
摘要 It is intended to provide a novel method by which an organic molecule such as a protein or an endocrine disruptor can be analyzed at a high sensitivity. A secondary ion mass spectrometry method with the use of a heavy ion beam as a primary ion beam, which can achieve a high sensitivity, is usable in detecting a biologically-relevant substance at, for example, the subattomole level. Thus, it becomes possible to favorably image a biologically-relevant sample.
申请公布号 WO2007145232(A1) 申请公布日期 2007.12.21
申请号 WO2007JP61864 申请日期 2007.06.13
申请人 KYOTO UNIVERSITY;MATSUO, JIRO 发明人 MATSUO, JIRO
分类号 G01N27/62;H01J49/14 主分类号 G01N27/62
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