发明名称 ENERGIZATION TEST SYSTEM OF ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide an energization test device which is free from accumulating static electricity for solving the problem that the energization testing board is electrified if the static electricity is stored with static electricity, the electronic component is insulation broken by the electrostatic discharge (ESD) at the time of attaching/releasing to/from the socket, where the performance test for the electronic components is performed in the thermostatic chamber under high and/or low temperatue while mounting the electronic components on the energization test board. SOLUTION: The energization test board is provided while being in contact with an insertion opening so as to seal the communication of air, and comprising a sealing part which is in contact with the inserting port of the thermostatic chamber is conductive, and a socket part supported by the tip of the sealing part and mounting a plurality of electronic components. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007327799(A) 申请公布日期 2007.12.20
申请号 JP20060158005 申请日期 2006.06.07
申请人 MITSUBISHI ELECTRIC CORP 发明人 KITABAYASHI HIROYOSHI;TAKEMOTO MEGUMI
分类号 G01R31/26 主分类号 G01R31/26
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