发明名称 SYSTEM AND METHOD FOR CUTTING SEMICONDUCTOR
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device cutting system capable of cutting semiconductor devices including an oddly shaped line from a semiconductor substrate at high speed, and ensuring good-quality cutting surface. <P>SOLUTION: The semiconductor cutting system cuts semiconductor devices 135' by cutting the semiconductor substrate 120 along scheduled cutting lines having a first portion, and a second portion having a shape different from the first portion. The semiconductor cutting system has a blade cutter 200 for cutting the semiconductor substrate along the first portion by using a cutting blade, and a laser cutter 100 for cutting the semiconductor substrate along the second portion by using a laser beam. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2007329359(A) 申请公布日期 2007.12.20
申请号 JP20060160322 申请日期 2006.06.08
申请人 APIC YAMADA CORP 发明人 ANDO SHUJI;UCHIYAMA SHIGEYUKI
分类号 H01L21/301;B23K26/38;B23K26/40;B23K101/40 主分类号 H01L21/301
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