发明名称 METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE INCLUDING AN IMPURITY-DOPED SILICON FILM
摘要 A process for manufacturing a semiconductor device consecutively includes forming a recess in the surface region of a silicon substrate, forming a gate insulation film on the surface of the recess, depositing a silicon electrode film including an oxygen-mixed layer extending parallel to the surface of the recess, injecting impurities into silicon the electrode film 17 , and heat-treating the silicon electrode film to diffuse impurities.
申请公布号 US2007290259(A1) 申请公布日期 2007.12.20
申请号 US20070765116 申请日期 2007.06.19
申请人 ELPIDA MEMORY, INC. 发明人 SAINO KANTA
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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