发明名称 FORMING METHOD AND COMPOUND SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method for forming a compound semiconductor layer on silicon equipped with an Si nanowire buffer layer. SOLUTION: In the method, an insulator layer 104 is formed on a silicon substrate 102, equipped with Si-nanowires 106 each tip end of which is exposed, to cover the substrate 102. The compound semiconductor 110 is selectively deposited on the tip end 108 of each Si nanowire. The compound semiconductor is grown from the tip end of each Si nanowire coated with the compound semiconductor so that the compound semiconductor covering the insulator is formed by lateral epitaxial overgrowth (LEO) process. Generally, the insulator layer covering the Si substrate is a thermosoftening insulator (TSI), silicon dioxide or SixNy (wherein, x is≤3 and y is≤4). The compound semiconductor may be GaN, GaAs, GaAlN or SiC. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007326771(A) 申请公布日期 2007.12.20
申请号 JP20070136032 申请日期 2007.05.22
申请人 SHARP CORP 发明人 LI TINGKAI;SHIEN TEN SUU
分类号 C30B29/38;C23C16/30;C30B25/18;C30B29/36;C30B29/42;H01L21/20;H01L21/205 主分类号 C30B29/38
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