发明名称 Exposure Apparatus and Device Manufacturing Method
摘要 There is provided an exposure apparatus capable of accurately performing an exposure process and a measurement process based on a liquid immersion method. The exposure apparatus (EX), which forms a liquid immersion area (AR 2 ) of a liquid (LQ) on an image surface side of a projection optical system (PL), and exposes a substrate (P) via the projection optical system (PL) and the liquid (LQ) of the immersion area (AR 2 ), is provided with a measuring device ( 60 ) which measures at least one of a property and composition of the liquid (LQ) for forming the liquid immersion area (AR 2 ).
申请公布号 US2007291239(A1) 申请公布日期 2007.12.20
申请号 US20050570219 申请日期 2005.06.07
申请人 发明人 SHIRAISHI KENICHI
分类号 G03B27/42;G03F7/20;H01L21/027 主分类号 G03B27/42
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