发明名称 |
APPARATUS AND METHOD OF TESTING LIQUID CRYSTAL DISPLAY MODULE |
摘要 |
An apparatus and a method for testing an LCD(Liquid Crystal Display) module are provided to generate a high driving voltage corresponding to each model by using voltage level data from an EEPROM(Electrically Erasable and Programmable Read Only Memory) in testing high voltage stress, thereby reducing failure generated by using a cable together with the other cable by applying an HVS(High Voltage Stress) power supply board to LCD modules of all model. An apparatus for testing an LCD module includes a memory(54) and a driving voltage generator(60). The memory outputs voltage level data corresponding to voltage logic data from the outside in testing HVS. The driving voltage generator generates a high driving voltage by using the voltage level data from the memory and supplies the high driving voltage to an LCD panel driving unit of driving an LCD panel. |
申请公布号 |
KR20070119329(A) |
申请公布日期 |
2007.12.20 |
申请号 |
KR20060053827 |
申请日期 |
2006.06.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, SEOK HYUN;BAK, DAE YANG |
分类号 |
G02F1/133 |
主分类号 |
G02F1/133 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|