发明名称 TEACHING METHOD OF AUTOMATIC OPTICAL INSPECTION SYSTEM, AND INSPECTION METHOD OF AUTOMATIC OPTICAL INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a teaching method of an automatic optical inspection system and an inspection method of the automatic optical inspection system for performing optical inspection of a printed circuit board unit. SOLUTION: This teaching method of the automatic optical inspection system for performing continuous optical inspection of a printed circuit board unit having the same pattern has characteristics wherein master data to the printed circuit board unit are prepared, and the master data are divided into a plurality of fine part inspection domains and registered, and reference data for discriminating each pattern component in the plurality of divided fine part inspection domains are registered. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007327957(A) 申请公布日期 2007.12.20
申请号 JP20070150107 申请日期 2007.06.06
申请人 AJUHITEK INC 发明人 SAI GENKO
分类号 G01N21/956;G06T1/00;H05K3/00 主分类号 G01N21/956
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