发明名称 SUBSTRATE INSPECTION UNIT, SUBSTRATE INSPECTION DEVICE INCLUDING IT, AND SUBSTRATE INSPECTION METHOD USING IT
摘要 PROBLEM TO BE SOLVED: To provide a substrate inspection unit which can decrease its production cost, and to provide a substrate inspection device and method including the unit. SOLUTION: The substrate inspection unit includes lower rollers, restriction members, a drive unit, and an inspection part. The lower rollers carry substrates contacting their bottoms. The restriction members are arranged so as to correspond to the lower rollers, and restrict the vertical motion of the substrates. The drive unit is engaged with the lower rollers, and drives them. The inspection part inspects the substrates which are carried to the inspection area by the lower rollers. Thus, the installation space is minimized, and the production cost can be decreased. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007327960(A) 申请公布日期 2007.12.20
申请号 JP20070152836 申请日期 2007.06.08
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 SON KYOICHI;KIM YOUNG IL;ZEN SANSAI;RYO TEIIKU
分类号 G01N21/956;G02F1/13 主分类号 G01N21/956
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