发明名称 VISUAL INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To solve the problem wherein unstable auto-focusing is connected to a misreport or overlooking of flaws in a method for specifying the position of the flaws from the difference between a detected image and a reference image by the conventional visual inspection methods due to comparison with the detected image, and for example where a chip, immediately after folding, is subjected to comparative inspection, the difference in image is generated due to the difference in the scanning direction of the detected image and the reference image, and accurate determination of the flaws by image comparison cannot be performed. SOLUTION: An auto-focusing region is arranged in front of the scanning direction of a strip imaging region, in order to improve the above-mentioned problem and a focal position is calculated from the contrast value of the auto-focusing region and the stage height is controlled. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007327891(A) 申请公布日期 2007.12.20
申请号 JP20060160415 申请日期 2006.06.09
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SUZUKI KATSUYA;SOEDA HIDEKI
分类号 G01N21/956;G01B11/30 主分类号 G01N21/956
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