发明名称 METAL LINE OF SEMICONDUCTOR DEVI CE AND METHOD FOR FORMING THE SAME
摘要 A metal interconnection of a semiconductor device is provided to prevent a metal interconnection and a contact plug from being short-circuited by forming a metal oxide layer on both lateral surfaces of the metal interconnection. A metal interconnection(120) is formed on a semiconductor substrate. A hard mask pattern(130) comes in contact with the upper surface of the metal interconnection. Both lateral surfaces of the metal interconnection is oxidized to form a metal oxide layer(140). Spacers(150) are formed on both sides of the hard mask pattern and the metal oxide layer. A contact plug(170) can be positioned between the metal interconnection wherein both lateral surfaces of the contact plug come in contact with the spacer.
申请公布号 KR20070119238(A) 申请公布日期 2007.12.20
申请号 KR20060053597 申请日期 2006.06.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JONG SOO
分类号 H01L21/28 主分类号 H01L21/28
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