发明名称 |
METAL LINE OF SEMICONDUCTOR DEVI CE AND METHOD FOR FORMING THE SAME |
摘要 |
A metal interconnection of a semiconductor device is provided to prevent a metal interconnection and a contact plug from being short-circuited by forming a metal oxide layer on both lateral surfaces of the metal interconnection. A metal interconnection(120) is formed on a semiconductor substrate. A hard mask pattern(130) comes in contact with the upper surface of the metal interconnection. Both lateral surfaces of the metal interconnection is oxidized to form a metal oxide layer(140). Spacers(150) are formed on both sides of the hard mask pattern and the metal oxide layer. A contact plug(170) can be positioned between the metal interconnection wherein both lateral surfaces of the contact plug come in contact with the spacer.
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申请公布号 |
KR20070119238(A) |
申请公布日期 |
2007.12.20 |
申请号 |
KR20060053597 |
申请日期 |
2006.06.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JONG SOO |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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