发明名称 |
Method for fabricating a semiconductor photosensor |
摘要 |
<p>A method for the manufacture of a pn-junction in a semiconductor component involves forming a first and a second zone (5.1,5.2) of a second conductivity type within a zone (1) of a first conductivity type by implantation and then combining, by successive diffusion processes, the first and second zones (5.1,5.2) into a continuous well (10) and then by implantation, a further zone (12) of the first conductivity type is formed and fully overlaps the first zone (5.1) of the second conductivity type and is larger than the second zone (5.2) of the second conductivity type.</p> |
申请公布号 |
EP1191598(B1) |
申请公布日期 |
2007.12.19 |
申请号 |
EP20000810853 |
申请日期 |
2000.09.20 |
申请人 |
SIEMENS SCHWEIZ AG |
发明人 |
POPOVIC, RADIVOJE;PAUCHARD, ALEXANDRE;ROCHAS, ALEXIS |
分类号 |
H01L27/14;H01L29/06;H01L21/265;H01L21/266;H01L21/324;H01L21/329;H01L21/8236;H01L27/088;H01L29/78;H01L29/861;H01L31/10;H01L31/103;H01L31/107;H01L31/18 |
主分类号 |
H01L27/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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