发明名称 MEMORY ELEMENT
摘要 On object of the invention is to provide a non-volatile memory device, in which data can be added to the memory device after a manufacturing process and forgery and the like by rewriting can be prevented, and a semiconductor device including the memory device. Another object of the invention is to provide a highly-reliable, inexpensive, and nonvolatile memory device and a semiconductor device including the memory device. A memory element includes a first conductive layer, a second conductive layer, a first insulating layer with a thickness of 0.1 nm or more and 4 nm or less being in contact with the first conductive layer, and an organic compound layer interposed between the first conductive layer, the first insulating layer, and the second conductive layer.
申请公布号 EP1866964(A1) 申请公布日期 2007.12.19
申请号 EP20060730321 申请日期 2006.03.22
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YUKAWA, MIKIO;OHSAWA, NOBUHARU;ASAMI, YOSHINOBU
分类号 H01L27/10;B82Y10/00;G11C13/00;H01L27/105;H01L27/112;H01L27/12;H01L27/13;H01L27/28;H01L51/00;H01L51/05 主分类号 H01L27/10
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