发明名称 EXPOSURE METHOD AND APPARATUS, AND ELECTRONIC DEVICE MANUFACTURING METHOD
摘要 <p>An exposure method suitable for forming a fine pattern constituting an electronic device, has high resolution and high cost performance. Two diffraction gratings (P1, P2) are arranged in a light path in series by permitting a wafer (W) or the like constituting the electronic device and the two diffraction gratings (P1, P2) to be at prescribed intervals. A contrast pattern of interference fringes generated by the diffraction gratings (P1, P2) is exposed on the wafer (W) or the like. The exposure is performed while changing a positional relationship between the wafer (W) or the like and the diffraction gratings (P1, P2) as needed.</p>
申请公布号 KR20070115982(A) 申请公布日期 2007.12.06
申请号 KR20077021502 申请日期 2006.02.23
申请人 NIKON CORPORATION 发明人 ICHIHARA YUTAKA;NAKAMURA AYAKO;SHIRAISHI NAOMASA;TANIMOTO AKIKAZU;KUDO YUJI
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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