发明名称 |
METHOD FOR REDUCING A RESET CURRENT FOR RESETTING A PORTION OF A PHASE CHANGE MATERIAL IN A MEMORY CELL OF A PHASE CHANGE MEMORY DEVICE AND THE PHASE CHANGE MEMORY DEVICE |
摘要 |
<p>A phase change memory device and a method for reducing a reset current for resetting a part of phase change materials within a memory cell of the phase change memory device are provided to increase resistance difference between a set state and a reset state of the phase change memory cell. When performing an initial firing method(300) of a phase change memory device, one of a plurality of memory blocks is selected(310). A plurality of selected word lines of the memory array blocks are enabled sequentially(320). A firing current is added to a plurality of bit lines of the selected cell array blocks(330). At this time, the firing current is larger than the reset current, thereby resetting the phase change material.</p> |
申请公布号 |
KR20070115542(A) |
申请公布日期 |
2007.12.06 |
申请号 |
KR20060050566 |
申请日期 |
2006.06.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEONG, CHANG WOOK;KONG, JUN HYOK;YI, JI HYE |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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