发明名称 METHOD FOR REDUCING A RESET CURRENT FOR RESETTING A PORTION OF A PHASE CHANGE MATERIAL IN A MEMORY CELL OF A PHASE CHANGE MEMORY DEVICE AND THE PHASE CHANGE MEMORY DEVICE
摘要 <p>A phase change memory device and a method for reducing a reset current for resetting a part of phase change materials within a memory cell of the phase change memory device are provided to increase resistance difference between a set state and a reset state of the phase change memory cell. When performing an initial firing method(300) of a phase change memory device, one of a plurality of memory blocks is selected(310). A plurality of selected word lines of the memory array blocks are enabled sequentially(320). A firing current is added to a plurality of bit lines of the selected cell array blocks(330). At this time, the firing current is larger than the reset current, thereby resetting the phase change material.</p>
申请公布号 KR20070115542(A) 申请公布日期 2007.12.06
申请号 KR20060050566 申请日期 2006.06.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEONG, CHANG WOOK;KONG, JUN HYOK;YI, JI HYE
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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