发明名称 CHEMICAL MECHANICAL POLISHING SLURRY USEFUL FOR COOPER/TANTALUM SUBSTRATE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a slurry for adequately polishing both copper and tantalum and a chemical mechanical polishing method using the same in the chemical mechanical polishing of a semiconductor substrate containing both copper and tantalum. <P>SOLUTION: The substrate containing copper and tantalum or tantalum nitride, or both tantalum and tantalum nitride is polished using a chemical mechanical polishing slurry including at least a polishing material, an oxidant, a complexing agent, at least a film forming agent, and acetic acid, wherein the mass ratio of the oxidant for acetic acid is at least 10 or larger. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2007318152(A) 申请公布日期 2007.12.06
申请号 JP20070158007 申请日期 2007.06.14
申请人 CABOT MICROELECTRONICS CORP 发明人 KAUFMAN VLASTA BRUSIC;KISTLER RODNEY C;WANG SHUMIN
分类号 H01L21/304;B24B37/00;C09G1/02;C09K3/14;H01L21/3205;H01L21/321 主分类号 H01L21/304
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