发明名称 |
TESTING COMPONENTS OF I/O PATHS OF AN INTEGRATED CIRCUIT |
摘要 |
Testing the components of I/O paths in an integrated circuit (190) at at-speed operation (i.e., the speed at which the integrated circuit would be operated during normal non-test mode). In an embodiment, boundary scan cells of different paths are connected in a scan chain, and each scan cell tests the corresponding component (e.g., buffer) by launching data at a first time instance and receiving the result of the data at a second time instance, with the duration between the first time instance and the second time instance corresponding to the at-speed operation. If the data is received accurately, the component may be deemed to be operating accurately at-speed. |
申请公布号 |
WO2007140366(A2) |
申请公布日期 |
2007.12.06 |
申请号 |
WO2007US69884 |
申请日期 |
2007.05.29 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED;ABRAHAM, JAIS;GOEL, ROHIT |
发明人 |
ABRAHAM, JAIS;GOEL, ROHIT |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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