发明名称 METHOD OF FORMING A PATTERN IN SEMICONDUCTOR DEVICE AND METHOD OF FORMING A CELL PATTERN IN NON-VOLATILE MEMORY USING THE SAME
摘要 <p>A method for forming a pattern of a semiconductor device and a method for forming a cell pattern of a non volatile memory using the same, are provided to prevent an insulating layer, a tunnel oxide layer and a dielectric from being damaged by forming a first and a second buffer layers to surround a circuit pattern. An insulating layer(104) including a first oxide and a conductive layer are formed on a substrate(100) sequentially. A mask pattern including a second oxide is formed on the conductive layer. A preliminary pattern is formed by patterning the mask pattern. A first buffer layer(116) is formed on the preliminary pattern. A space type second buffer layer(120) is formed on the first buffer layer. The first buffer layer and the mask pattern are removed. A pattern structure is formed by removing the second buffer layer.</p>
申请公布号 KR20070115353(A) 申请公布日期 2007.12.06
申请号 KR20060049639 申请日期 2006.06.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, YONG KYU;HAN, JEON GUK;KIM, YOUNG HO;CHUN, MYUNG JO
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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