发明名称 |
METHOD OF FORMING A PATTERN IN SEMICONDUCTOR DEVICE AND METHOD OF FORMING A CELL PATTERN IN NON-VOLATILE MEMORY USING THE SAME |
摘要 |
<p>A method for forming a pattern of a semiconductor device and a method for forming a cell pattern of a non volatile memory using the same, are provided to prevent an insulating layer, a tunnel oxide layer and a dielectric from being damaged by forming a first and a second buffer layers to surround a circuit pattern. An insulating layer(104) including a first oxide and a conductive layer are formed on a substrate(100) sequentially. A mask pattern including a second oxide is formed on the conductive layer. A preliminary pattern is formed by patterning the mask pattern. A first buffer layer(116) is formed on the preliminary pattern. A space type second buffer layer(120) is formed on the first buffer layer. The first buffer layer and the mask pattern are removed. A pattern structure is formed by removing the second buffer layer.</p> |
申请公布号 |
KR20070115353(A) |
申请公布日期 |
2007.12.06 |
申请号 |
KR20060049639 |
申请日期 |
2006.06.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, YONG KYU;HAN, JEON GUK;KIM, YOUNG HO;CHUN, MYUNG JO |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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