发明名称 POWER SUPPLY APPARATUS AND SEMICONDUCTOR TEST SYSTEM USING SAME
摘要 PROBLEM TO BE SOLVED: To realize a power supply apparatus and a semiconductor test system, which can be made compact even in the case that a voltage applied to a load is adjustable. SOLUTION: The power supply apparatus is realized by improving a power supply apparatus which feeds back an applied voltage being applied to the load, acquires an error between the applied voltage and a set up voltage, brings its output amplifier to increase or decrease the amount of current flowing in the load based on the error, and applies a prescribed voltage to the load. The apparatus is characterized by disposing a voltage converting section therein, which brings a voltage level of a supply voltage of the output amplifier to follow a voltage level of the set up voltage. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007315829(A) 申请公布日期 2007.12.06
申请号 JP20060143496 申请日期 2006.05.24
申请人 YOKOGAWA ELECTRIC CORP 发明人 KOURA ISAMU
分类号 G01R31/28;G01R31/26 主分类号 G01R31/28
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