| 摘要 |
A Bemf detect circuit is configured for modeling Bemf error via calculation of time correlations associated with two or more different non-calibrated sense resistor gain values to derive a calibrated sense resistor gain value. A method is provided for calibrating a Bemf detector circuit by setting a sense resistor gain to a plurality of different gain values, observing Bemf sample values for each of the gain values, and deriving a calibrated gain value by non-iteratively modeling the relationship between the gain values and the associated Bemf sample values.
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