发明名称 PATTERN FORMING METHOD
摘要 <p>It is possible to provide a pattern forming method capable of reducing the resolution irregularities and concentration irregularities of a pattern formed on an exposed surface of a pattern forming material so as to effectively form the pattern with a high resolution. For this, a photosensitive layer of a pattern forming material formed on a support body is layered on a substrate to be treated. After this, an exposure head including light irradiation means and light modulation means having n plotting units arranged two-dimensionally and with the column direction of the plotting units at a set inclination angle R with respect to the scan direction is used for the photosensitive layer so as to execute: a step for specifying the use plotting units used for N-degree exposure by the plotting unit specification means for the exposure head; a step for controlling the plotting units by the plotting unit control means for the exposure head; and a step for relatively shifting the exposure head in the scan direction with respect to the photosensitive layer for performing exposure.</p>
申请公布号 KR20070115909(A) 申请公布日期 2007.12.06
申请号 KR20077019483 申请日期 2007.08.24
申请人 FUJI FILM CORPORATION 发明人 TAKASHIMA MASANOBU;SUMI KATSUTO;KOWADA KAZUTERU;SUZUKI ISSEI;UEMURA TAKAYUKI
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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