发明名称 MEASURING DEVICE AND INSPECTION DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To quickly carry out measurements of high accuracy on electrical parameters among prescribed parts in an object to be measured. <P>SOLUTION: A measuring device comprises an I/V conversion part 3 for converting a current I, made to flow between conductor patterns 101 and 101 in a circuit board 100 by the application of a DC signal S1 in current/voltage conversion by a feed-back type; and a control part 5 for measuring an insulating resistor Rs between the conductor patterns 101 and 101, based on an output signal S2 converted by the I/V conversion part 3 and the voltage of the DC signal S1. The I/V conversion part 3 connects a pair of diodes 32a and 32b as the feed-back impedance of the current/voltage conversion. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2007315981(A) 申请公布日期 2007.12.06
申请号 JP20060147529 申请日期 2006.05.29
申请人 HIOKI EE CORP 发明人 KOIKE SHINICHI
分类号 G01R31/02;G01R15/09;G01R19/00 主分类号 G01R31/02
代理机构 代理人
主权项
地址