发明名称 Charge-trapping memory device and methods for its manufacturing and operation
摘要 A charge-trapping memory device includes an array of non-volatile memory cells. The array has at least a first sector and a second sector. Each sector includes a multiplicity of memory cells. Each memory cell is adapted to trap an amount of charge indicative of a programming state. A control circuit is operationally connected to the array and is adapted to access a memory cell of the array by means of storing charge in or removing charge from the memory cell. A disturb detection circuit is operationally connected to the array or the control circuit and is adapted to detect a disturbance level of the first sector based on a disturbance caused by accessing at least one memory cell of the second sector. A disturb leveling circuit is operationally connected to the array and the disturb detection circuit and is adapted to backup the programming state of memory cells of the first sector if the detected disturbance level exceeds a predefined threshold.
申请公布号 US2007280002(A1) 申请公布日期 2007.12.06
申请号 US20060444289 申请日期 2006.05.31
申请人 SUDHINDRA PRASAD THOLASAMPATTI 发明人 SUDHINDRA PRASAD THOLASAMPATTI SUBRAMANIAN
分类号 G11C16/04 主分类号 G11C16/04
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