发明名称 INTERFERENCE ANALYZER FOR FINE FLEXURAL OSCILLATIONS
摘要 PROBLEM TO BE SOLVED: To find the shape of an object by sweeping a surface of the object having a large dimension, while measuring it at a sensitivity of nanometer or sub-nanometer. SOLUTION: It is known that the force acting between an atom on the surface of the object and an atom of the probe is an attractive force that is stronger than Coulomb's force, and by making the cantilever for holding a probe resonate, by measuring vibration of the cantilever for holding the probe by an interferometer, and by finding the changes in the secondary higher harmonics of the resonance frequency contained in measured wave, from the interferometer, and finding the changes in the further higher higher-harmonics included therein, the cantilever and the other are moved to bring the intensity of a spectrum of the higher harmonics to constant values, and the surface of the object is swept thereby. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007316043(A) 申请公布日期 2007.12.06
申请号 JP20060170650 申请日期 2006.05.24
申请人 SUZUKI NORITO 发明人 SUZUKI NORITO
分类号 G01B11/00;G01Q10/02;G01Q60/24;G01Q60/32 主分类号 G01B11/00
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